Low-loss Ca 5-xSr xA 2TiO 12 [A=Nb,Ta] ceramics: Microwave dielectric properties and vibrational spectroscopic analysis

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Bijumon, Pazhoor Varghese ^a   Sebastian, Mailadil Thomas ^a   Dias, Anderson ^b   Moreira, Roberto Luiz ^b   Mohanan, Pezholil ^c  

^a REGIONAL RESEARCH LABORATORY CSIR   (India)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^c Department of Physics   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS MEMORY (DRAM); MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE INTEGRATED CIRCUITS (MIC); VIBRATIONAL SPECTROSCOPIC ANALYSIS;

CRYSTAL STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MICROSTRUCTURE; MICROWAVE DEVICES; PERMITTIVITY; PEROVSKITE; PHASE DIAGRAMS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; WIRELESS TELECOMMUNICATION SYSTEMS; X RAY DIFFRACTION ANALYSIS;

CERAMIC MATERIALS;

EID: 20944450370     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1897065     Document Type: Article

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