Magnetic and transport measurements on the layered III-VI diluted magnetic semiconductor In 1-x Mn xSe

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Pekarek, T M ^a   Arenas, D J ^a   Miotkowski, I ^b   Ramdas, A K ^b  

^a UNIVERSITY OF NORTH FLORIDA   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SIZE; MAGNETIC ANALYSIS; MAGNETIC MEASUREMENT; MECHANICAL MILLING;

CRYSTALLINE MATERIALS; DOPING (ADDITIVES); HEAT TREATING FURNACES; MAGNETIC FIELD EFFECTS; MILLING (MACHINING); MOSSBAUER SPECTROSCOPY; PHASE TRANSITIONS; TIN; X RAY DIFFRACTION ANALYSIS;

MAGNETITE;

EID: 20944445379     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1851408     Document Type: Conference Paper

References (21)

1. T. M. Pekarek, B. C. Crooker, I. Miotkowski, and A. K. Ramdas, J. Appl. Phys. 83, 6557 (1998).
2. N. C. Fernelius, Prog. Cryst. Growth Charact. Mater. 28, 275 (1994).
3. A. Segura, J. Bouvier, M. V. Andŕs, F. J. Manjón, and V. Muñoz, Phys. Rev. B 56, 4075 (1997).
4. D. R. Suhre, N. B. Singh, V. Balakrishni, N. C. Fernelius, and F. K. Hopkins, Opt. Lett. 22, 775 (1997).
5. S. Meng, B. R. Schroeder, and M. A. Olmstead, Phys. Rev. B 61, 7215 (2000).
6. D. E. N. Brancus and G. Stan, Phys. Rev. B 63, 235203 (2001).
7. M. O. D. Camara, A. Mauger, and I. Devos, Phys. Rev. B 65, 205308 (2002).
8. I. H. Choi and P. Y. Yu, Phys. Rev. B 68, 165339 (2003).
9. G. Ferlat, H. Xu, V. Timoshevskii, and X. Blase, Phys. Rev. B 66, 085210 (2002).
10. S. Nüsse, P. H. Bolivar, H. Kurz, F. Levy, A. Chevy, and O. Lang, Phys. Rev. B 55, 4620 (1997).
11. D. Errandonea, A. Segura, J. F. Sánchez-Royo, V. Muñoz, P. Grima, A. Chevy, and C. Ulrich, Phys. Rev. B 55, 16217 (1997).
12. F. J. Manjon, D. Errandonea, A. Segura, and V. Munoz, Phys. Rev. B 63, 125330 (2001).
13. J. Z. Wan, J. L. Brebner, and R. Leonelli, Phys. Rev. B 53, 15413 (1996).
14. F. J. ManjÓn, A. Segura, and V. Muñoz, J. Appl. Phys. 81, 6651 (1997).
15. A. B. M. O. Islam, T. Tambo, and C. Tatsuyama, J. Appl. Phys. 85, 4003 (1999).
16. N. Okamoto, T. Takahashi, and H. Tanaka, Appl. Phys. Lett. 73, 794 (1998).
17. Semiconductors and Semimetals, edited by, J. K. Furdyna, and, J. Kossut, (Academic, Boston, 1988), Vol. 25.
18. T. M. Pekarek, M. Duffy, J. Garner, B. C. Crooker, I. Miotkowski, and A. K. Ramdas, J. Appl. Phys. 87, 6448 (2000).
19. C. Fuller, A. Douglas, J. Garner, T. M. Pekarek, I. Miotkowski, and A. K. Ramdas, Phys. Rev. B 65, 195211 (2002).
20. T. M. Pekarek, C. L. Fuller, J. Garner, B. C. Crooker, I. Miotkowski, and A. K. Ramdas, J. Appl. Phys. 89, 7030 (2001).
21. P. Somasundaram, D. Kim, J. M. Honig, T. M. Pekarek, T. Gu, and A. I. Goldman, J. Appl. Phys. 83, 7243 (1998).