Formation of ZnS/SiO2 nanocables

Applied Physics Letters

Volumn 86, Issue 17, 2005, Pages 1-3

  Fan, Xia ^a,d   Meng, Xiang Min ^a   Zhang, Xiao Hong ^a   Wu, Shi Kang ^a   Lee, Shuit Tong ^b,c  

^a TECHNICAL INSTITUTE OF PHYSICS AND CHEMISTRY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^d UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; EVAPORATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SILICA; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CHEMICAL REACTIVITY; NANOCABLES; NANOSIZED SEMICONDUCTOR STRUCTURES; NONLINEAR OPTICAL BEHAVIOR;

NANOSTRUCTURED MATERIALS;

EID: 20844461652     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1919394     Document Type: Article

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