|
Volumn 86, Issue 21, 2005, Pages 1-3
|
Stable single-atom contacts of zinc whiskers
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRODES;
ELECTRON TUNNELING;
ELECTRONIC PROPERTIES;
ELECTROPLATING;
LOW TEMPERATURE OPERATIONS;
SUPERCONDUCTING TRANSITION TEMPERATURE;
THIN FILMS;
ZINC;
ELECTRICAL TRANSPORT PROPERTIES;
MECHANICALLY CONTROLLABLE BREAK JUNCTIONS (MCB);
TUNNEL CONTACTS;
ZINC WHISKERS;
ELECTRON TRANSPORT PROPERTIES;
|
EID: 20844460265
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1926408 Document Type: Article |
Times cited : (5)
|
References (18)
|