Monitoring of silicon solar cell technology via the surface photovoltage method

Solar Energy Materials and Solar Cells

Volumn 88, Issue 3, 2005, Pages 331-337

  Tousek J ^a   Touskova J ^a   Poruba, A ^b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b Solartec Sro   (Czech Republic)

Author keywords

Diffusion length; Silicon wafers; Solar cells; Surface photovoltage

Indexed keywords

DEPOSITION; DIFFUSION; ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; ETCHING; HYDROGEN; MONITORING; PASSIVATION; PHOTONS; PLASMAS; SILICON WAFERS; SODIUM COMPOUNDS;

DIFFUSION LENGTH; PHOTON ENERGY; PLASMA DEPOSITION; SURFACE PHOTOVOLTAGE (SPV) TECHNIQUE;

SOLAR CELLS;

EID: 20744443927     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2005.03.013     Document Type: Article

References (7)

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