Contactless photovoltage method for measurement of diffusion length of minority carriers in solar cells

Solar Energy Materials and Solar Cells

Volumn 64, Issue 1, 2000, Pages 29-35

  Tousek J ^a   Kindl, D ^a   Touskova J ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DIFFUSION; ELECTRIC SPACE CHARGE; PHOTOVOLTAIC EFFECTS; SURFACE TREATMENT;

CONTACTLESS PHOTOVOLTAGE METHOD; DIFFUSION LENGTH; SURFACE PHOTOVOLTAGE METHOD;

SILICON SOLAR CELLS;

EID: 0343825866     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00039-8     Document Type: Article

References (8)

1. D.K. Schroder, Semiconductor Material and Device Characterization, Wiley, New York, 1990.
2. J.W. Orton, P. Blood, The Electrical Characterization of Semiconductors, Academic Press, New York, 1990.
3. A.M. Goodman, J. Appl. Phys. 32 (1961) 2550.
4. ASTM F391-90a, Annual Book of ASTM Standards, American Society for Testing Materials, Philadelphia, 1990.
5. A.R. Moore, J. Appl. Phys. 54 (1983) 222.
6. C.L. Chiang, S. Wagner, IEEE Trans. Electron Dev. ED 32 (1985) 1722.
7. J.M. Gee, Proceedings of the 25th IEEE PVSEC Conference WA, 1996.
8. D.E. Aspnes, in: Properties of Silicon, EMIS Datareviews Series No. 4, INSPEC, London, 1988.