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Volumn 25, Issue 5-6, 2005, Pages 598-607
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Procedures for testing manufacturing precision Cpbased on (X̄, R) or (X̄, S) control chart samples
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Author keywords
Critical value; Lower confidence bound; p value; Process precision index; Testing hypothesis
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Indexed keywords
COMPUTER SOFTWARE;
PROBABILITY DENSITY FUNCTION;
PROCESS ENGINEERING;
PRODUCT DEVELOPMENT;
STATISTICAL METHODS;
STATISTICAL PROCESS CONTROL;
CRITICAL VALUE;
LOWER CONFIDENCE BOUND;
P-VALUE;
PROCESS PRECISION INDEX;
TESTING HYPOTHESIS;
PRODUCTION ENGINEERING;
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EID: 20644431586
PISSN: 02683768
EISSN: None
Source Type: Journal
DOI: 10.1007/s00170-003-1870-0 Document Type: Article |
Times cited : (7)
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References (12)
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