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Volumn 7, Issue 5, 2005, Pages 332-338

Investigation of the exchange bias effect by quantitative magnetic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; COMPUTER SIMULATION; FERROMAGNETISM; INTERFACES (MATERIALS); MAGNETIC FIELDS; MAGNETIC MOMENTS; MAGNETIZATION; THIN FILMS;

EID: 20444504746     PISSN: 14381656     EISSN: None     Source Type: Journal    
DOI: 10.1002/adem.200500088     Document Type: Article
Times cited : (12)

References (14)
  • 4
    • 1442270634 scopus 로고    scopus 로고
    • (Eds: E. Meyer, H. J. Hug, R. Bennewitz), Springer, Berlin Ch. 4
    • H. J. Hug in Scanning Probe Microscopy, (Eds: E. Meyer, H. J. Hug, R. Bennewitz), Springer, Berlin 2003, Ch. 4.
    • (2003) Scanning Probe Microscopy
    • Hug, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.