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Volumn 7, Issue 5, 2005, Pages 332-338
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Investigation of the exchange bias effect by quantitative magnetic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTIFERROMAGNETISM;
COMPUTER SIMULATION;
FERROMAGNETISM;
INTERFACES (MATERIALS);
MAGNETIC FIELDS;
MAGNETIC MOMENTS;
MAGNETIZATION;
THIN FILMS;
EXCHANGE BIAS;
MAGNETIC FORCE MICROSCOPY (MFM);
SCANNING FORCE MICROSCOPY (SFM);
SURFACE CHARGE DENSITY;
MULTILAYERS;
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EID: 20444504746
PISSN: 14381656
EISSN: None
Source Type: Journal
DOI: 10.1002/adem.200500088 Document Type: Article |
Times cited : (12)
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References (14)
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