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Volumn 546, Issue 1-2, 2005, Pages 56-59

Status and performance of the CDF Run II silicon detector

Author keywords

CDF Run II upgrade; Radiation damage; Silicon vertex detector

Indexed keywords

CAPACITORS; DATA REDUCTION; FATIGUE OF MATERIALS; LEAKAGE CURRENTS; RADIATION DAMAGE; SENSORS; SIGNAL PROCESSING; SILICON;

EID: 20444491254     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.03.129     Document Type: Conference Paper
Times cited : (1)

References (8)
  • 6
    • 15844368021 scopus 로고    scopus 로고
    • Proceedings of the fifth international symposium on development and application of semiconductor tracking devices
    • B. Brau, Proceedings of the Fifth International Symposium on Development and Application of Semiconductor Tracking Devices, Nucl. Instr. and Meth A 541 (2005) 73-77.
    • (2005) Nucl. Instr. and Meth a , vol.541 , pp. 73-77
    • Brau, B.1
  • 8
    • 20444453605 scopus 로고    scopus 로고
    • Proceedings of the 12th international workshop on vertex detectors
    • to appear
    • S. Worm, Proceedings of the 12th International Workshop on Vertex Detectors, Nucl. Instr. and Meth. A, to appear.
    • Nucl. Instr. and Meth. a
    • Worm, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.