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Volumn 518, Issue 1-2, 2004, Pages 277-280

Wire-bond failures induced by resonant vibrations in the CDF silicon detector

(17)  Bolla, G a   Atac, M b   Pavlicek, V b   Nahn, S c   Garcia Sciveres, M d   Mumford, R e   Nguyen, T b   Forrester, S f   Hill, C g   Olszewski, J e   Rahaman, A h   Goldstein, J i   Ashmanskas, B j   Maruyama, T k   Zimmerman, T b   Moccia, S b   Lewis, J b  


Author keywords

CDF; Tracker

Indexed keywords

FAST FOURIER TRANSFORMS; HARDWARE; MAGNETIC FIELDS; NATURAL FREQUENCIES; READOUT SYSTEMS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR LASERS; THERMAL EXPANSION; VIBRATION MEASUREMENT;

EID: 0942288172     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.10.081     Document Type: Conference Paper
Times cited : (26)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.