The structural properties of the PANI/CSA conducting polymer system studied by synchrotron radiation surface diffraction

Fibres and Textiles in Eastern Europe

Volumn 11, Issue 5, 2003, Pages 96-100

  Luzny W ^a   Samuelsen, E J ^b   Breiby, D W ^b  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

Polyaniline and derivatives; Polycrystalline thin films; X ray diffraction

Indexed keywords

ANISOTROPY; CRYSTALLINE MATERIALS; POLYANILINE; SYNCHROTRON RADIATION; THIN FILMS;

CRYSTALLINE STRUCTURE; M-CRESOL; POLYANILINE AND DERIVATIVES; POLYCRYSTALLINE THIN FILM; POLYMER SYSTEMS; PROTONATED; RADIATION SURFACES; SURFACE DIFFRACTION; THIN-FILMS; X- RAY DIFFRACTIONS;

X RAY DIFFRACTION;

POLYANILINE;

EID: 20444491201     PISSN: 12303666     EISSN: 23007354     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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