메뉴 건너뛰기




Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2897-2900

Sintering time dependence of microwave dielectric properties and crystal structure in Y2BaZnO5 ceramic

Author keywords

Dielectric property; Electron microscopy; Powders solid state reaction; Sintering; X ray method

Indexed keywords

CRYSTAL STRUCTURE; DEGRADATION; MICROWAVES; NATURAL FREQUENCIES; PERMITTIVITY; SINTERING; VAPORIZATION; YTTRIUM COMPOUNDS;

EID: 20444482420     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.161     Document Type: Article
Times cited : (14)

References (10)
  • 1
    • 0033749873 scopus 로고    scopus 로고
    • Layered Al2O3-TiO2 composite dielectric resonators
    • Breeze, J., Penn, S. J., Poole, M. and Alford, N.McN., Layered Al2O3-TiO2 composite dielectric resonators. Electron. Lett., 2000, 36, 883-884.
    • (2000) Electron. Lett. , vol.36 , pp. 883-884
    • Breeze, J.1    Penn, S.J.2    Poole, M.3    Alford, N.McN.4
  • 2
    • 0038716999 scopus 로고    scopus 로고
    • Niobate-based microwave dielectrics suitable for third generation mobile phone base stations
    • H. Huges D.M. Iddles and I.M. Reaney Niobate-based microwave dielectrics suitable for third generation mobile phone base stations Appl. Phys. Lett. 79 2001 2952-2954
    • (2001) Appl. Phys. Lett. , vol.79 , pp. 2952-2954
    • Huges, H.1    Iddles, D.M.2    Reaney, I.M.3
  • 5
    • 84928809109 scopus 로고
    • A dielectric resonator method of measuring inductive capacities in the millimeter range
    • MTT-8
    • B.W. Hakki and P.D. Coleman A dielectric resonator method of measuring inductive capacities in the millimeter range IRE Trans. Microwave Theory Technol. MTT-8 1960 402-410
    • (1960) IRE Trans. Microwave Theory Technol. , pp. 402-410
    • Hakki, B.W.1    Coleman, P.D.2
  • 6
    • 0022100780 scopus 로고
    • Microwave measurement of dielectric properties of low loss materials by the dielectric rob resonator method
    • MMT-33
    • Y. Kobayahsi and M. Katoh Microwave measurement of dielectric properties of low loss materials by the dielectric rob resonator method IEEE Trans. Microwave Theory Technol. MMT-33 1985 586-592
    • (1985) IEEE Trans. Microwave Theory Technol. , pp. 586-592
    • Kobayahsi, Y.1    Katoh, M.2
  • 7
    • 0004326059 scopus 로고
    • R.A. Young ed Oxford University Press Oxford (Chapter 13)
    • F. Izumi R.A. Young In Rietveld Method ed 1993 Oxford University Press Oxford (Chapter 13)
    • (1993) Rietveld Method
    • Izumi, F.1
  • 8
    • 0002211129 scopus 로고
    • Profile refinement method for nuclear and magnetic structure
    • H.M. Rietveld Profile refinement method for nuclear and magnetic structure J. Appl. Crystallogr. 2 1969 65-71
    • (1969) J. Appl. Crystallogr. , vol.2 , pp. 65-71
    • Rietveld, H.M.1
  • 9
    • 0020810586 scopus 로고
    • 5 (A=Y, Sm, Eu, Gd, Dy, Ho, Er, Yb) oxides
    • 5 (A = Y, Sm, Eu, Gd, Dy, Ho, Er, Yb) oxides J. Solid State Chem. 49 1983 150-156
    • (1983) J. Solid State Chem. , vol.49 , pp. 150-156
    • Michel, C.1    Reveau, B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.