Effects of modulation defects on hadamard transform time-of-flight mass spectrometry (HT-TOFMS)

Journal of the American Society for Mass Spectrometry

Volumn 14, Issue 3, 2003, Pages 278-286

  Kimmel, Joel R ^a   Fernández, Facundo M ^a,b   Zare, Richard N ^a  

^a STANFORD UNIVERSITY   (United States)

^b University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; MASS SPECTROMETRY; SIGNAL ENCODING;

ENCODING SEQUENCES;

MULTIPLEXING;

ION;

MASS SPECTROMETRY;

ACCELERATION; ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; ELECTRIC POTENTIAL; ELECTRONICS; HADAMARD TRANSFORM TIME OF FLIGHT MASS SPECTROMETRY; INSTRUMENT; MASS SPECTROMETRY; SIGNAL NOISE RATIO; SIMULATION; TIME;

EID: 0038038533     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-0305(03)00006-0     Document Type: Article

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