Fabrication and characterization of thin Δe detectors for spectroscopic application

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 546, Issue 1-2, 2005, Pages 312-318

  Thungström, Göran ^a   Westerberg, Lars ^b   Spohr, Reimar ^c   Sture Petersson, C ^a,d  

^a MID SWEDEN UNIVERSITY   (Sweden)

^b UPPSALA UNIVERSITY   (Sweden)

^c GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^d ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

E detector; Energy straggling; Ion channeling; Thin silicon detector

Indexed keywords

CAPACITANCE; ENERGY DISSIPATION; HYDROPHOBICITY; MASKS; PROBABILITY; RADIATION DETECTORS; SILICON WAFERS; SPECTROSCOPIC ANALYSIS; TELESCOPES; THRESHOLD VOLTAGE;

Δ DETECTOR; ENERGY STRAGGLING; ION CHANNELING; THIN SILICON DETECTOR;

SEMICONDUCTOR DEVICES;

EID: 20444468547     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.03.053     Document Type: Conference Paper

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