Optical studies of 0.65PbMg1/3Nb2/3O3 -0.35PbTiO3 thin films

Journal of the European Ceramic Society

Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2313-2317

  Chan, K Y ^a   Tsang, W S ^a   Mak, C L ^a   Wong, K H ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Films; Optical properties; Pulsed laser deposition; Titanates

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; EPITAXIAL GROWTH; MAGNESIA; OPACITY; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

DEPOSITION TEMPERATRUES; EXTINCTION COEFFICIENTS; OPTICAL BAND GAP ENERGIES; SPECTROSCOPIC ELLIPSOMETER (SE);

LEAD COMPOUNDS;

FILM;

EID: 20444465673     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.063     Document Type: Article

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