Contact mode potentiometric measurements with an atomic force microscope on high resistive perovskite thin films

Journal of the European Ceramic Society

Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2353-2356

  Reichenberg, B ^a   Tiedke, S ^a   Szot, K ^b   Peter, F ^b   Waser, R ^b   Tappe, S ^c   Schneller, T ^c  

^a AIXACCT SYSTEMS GMBH   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Atomic force microscope; Defects; Electrical properties; Surfaces

Indexed keywords

AMPLIFIERS (ELECTRONIC); ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ELECTRIC VARIABLES MEASUREMENT; OPTIMIZATION; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); THIN FILMS;

CONTACT MODE POTENTIOMETRIC MEASUREMENTS; ELECTRICAL TRANSPORT MECHANISMS; ELECTROMETER AMPLIFIERS; GALVANIC CONTACT;

PEROVSKITE;

FILM;

EID: 20444461609     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.195     Document Type: Article

References (15)

1. C. Ohly S. Hoffmann K. Szot and R. Waser High temperature conductivity behavior of doped SrTiO 3 thin films. Integrated Ferroelectr. 33 1-4 2001 363-372
2. W. Hofmann S. Hoffmann and R. Waser Advanced chemical deposition techniques - from research to production. Thin Solid Films 305 1997 66
3. R. Waser and D.M. Smyth Ferroelectr. Thin Films: Synth. Basic Properties 1996 47
4. K.M. Schindler A. Kindlein C. Hagendorf H.T. Langhammer and H. Neddermeyer Surface physical studies of barium titanate ceramics Conference Paper 21st European Conference on Surface Science 2002
5. B. Reichenberg K. Szot T. Schneller S. Tiedke and R. Waser Inhomogeneous local conductivity induced by thermal reduction in BaTiO 3 thin films and single crystals Integrated Ferroelectr. 61 2004 43-49
6. T. Trenkeler P.D. Wolf W. Vandervorst and L. Hellemans Nanopotentiometry: Local potential measurements in complementary metal-oxide-semiconductor transistors using atomic force microscopy J. Vac. Sci. Technol. B 16 1 1998 367-372
7. S.V. Kalinin and D.A. Bonnell Surface potential at surface-interface junctions in SrTiO 3 bicrystals Phys. Rev. B 62 15 2000 10419-10430
8. M. Nonnenmacher, M.P. O'Boyle and H.K. Wickramasinghe Kelvin probe force microscopy. Appl. Phys. Lett. 58 1991 2921-2923
9. P. Muralt and D.W. Pohl Scanning tunneling potentiometry. Appl. Phys. Lett. 48 1986 514-516
10. S. Hoffmann and R. Waser Control of the morphology of CSD-prepared (Ba, Sr) TiO 3 thin films J. Eur. Ceram. Soc. 19 1999 1339-1343
11. R. Waser T. Schneller S. Hoffmann-Eifert and P. Ehrhart Advanced chemical deposition techniques - From research to production Integrated erroelectr. 36 2001 3-20
12. C. Ohly S. Hoffmann K. Szot and R. Waser Electrical conductivity and segregation effects of doped SrTiO 3 thin films. J. Eur. Ceram. Soc. 21 2001 1673-1676
13. K. Prume A. Roelofs T. Schmitz B. Reichenberg S. Tiedke and R. Waser Compensation of the parasitic capacitance of a SFM cantilever used for measurements on ferroelectric capacitors of submicron size by means of finite element simulations. Jpn. J. Appl. Phys. Part 1 41 2002 7198
14. F. Peter K. Szot B. Reichenberg J. Szade S. Tiedke R. Waser et al. Piezoresponse in the light of surface adsorbates-relevance of defined surface conditions for perovskite materials. J. Appl. Lett. 85 14 2004 2896-2898
15. K. Szot W. Speier S. Cramm J. Heroins Ch. Freiburg R. Waser et al. Surface layer on KNbO 3 and the hysteresis loop anomaly J. Phys. Chem. Solids 57 11 1996 1765-1775