Position sensitive detection coupled to high-resolution time-of-flight mass spectrometry: Imaging for molecular beam deflection experiments

Review of Scientific Instruments

Volumn 75, Issue 12, 2004, Pages 5221-5227

  Abd El Rahim, M ^a   Antoine, R ^a   Arnaud, L ^a   Barbaire, M ^a   Broyer, M ^a   Clavier, Ch ^a   Compagnon, I ^a   Dugourd, Ph ^a   Maurelli, J ^a   Rayane, D ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; ELECTRIC PROPERTIES; MAGNETIC PROPERTIES; MOLECULAR BEAMS; PIEZOELECTRIC DEVICES;

ION PACKETS; POSITION SENSITIVE DETECTORS; QUADRUPOLE MASS ANALYZERS;

MASS SPECTROMETERS;

EID: 20444457065     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1813112     Document Type: Article

References (27)

1. W. Gerlach and O. Stem, Ann. Phys. (Leipzig) 74, 673 (1924).
2. K. D. Bonin and V. V. Kresin, Electric-Dipole Polarizabilities of Atoms, Molecules and Clusters (World Scientific, Singapore, 1997).
3. I. M. L. Billas, A. Châtelain, and W. A. deHeer, J. Magn. Magn. Mater. 168, 64 (1997).
4. T. M. Miller and B. Bederson, Adv. At. Mol. Phys. 13, 1 (1977).
5. M. Broyer, R. Antoine, E. Benichou, I. Compagnon, P. Dugourd, and D. Rayane, C. R. Physique 3, 301 (2002).
6. J. P. Bucher and L. A. Bloomfleld, Int. J. Mod. Phys. B 7, 1079 (1993).
7. H. Scheffers and J. Stark, Phys. Z. 35, 625 (1934).
8. H. Scheffers and J. Stark, Phys. Z. 37, 217 (1936).
9. W. D. Hall and J. C. Zom, Phys. Rev. A 10, 1141 (1974).
10. W. D. Knight, K. Clemenger, W. A. deHeer, and W. A. Saunders, Phys. Rev. B 31, 2539 (1985).
11. W. A. deHeer and P. Milani, Rev. Sci. Instrum. 62, 670 (1991).
12. W. A. deHeer, P. Milani, and A. Châtelain, Phys. Rev. Lett. 63, 2834 (1989).
13. M. B. Knickelbein, J. Chem. Phys. 115, 5957 (2001).
14. R. Moro, X. Xu, S. Yin, and W. A. deHeer, Science 300, 1265 (2003).
15. E. Benichou et al., Phys. Rev. A 59, R1 (1999).
16. J. Ullrich, R. Moshammer, R. Doerner, O. Jagutzki, V. Merge, H. Schmidt-Boecking, and L. Spielberger, J. Phys. B 30, 2917 (1997).
17. J. H. D. Eland, Meas. Sci. Technol. 5, 1501 (1994).
18. O. Jagutzki, V. Mergel, K. Ullmann-Pfleger, L. Spielberger, U. Meyer, R. Dörner, and H. Schmidt-Böcking, in Imaging Spectroscopy IV, Proceedings of International Symposium on Optical Science Engineering and Instrumentation edited by M. R. Descour, [Proc. SPIE3438, 322 (1998)].
19. R. Antoine, P. Dugourd, D. Rayane, E. Benichou, M. Broyer, F. Chandezon, and C. Guet, J. Chem. Phys. 110, 9771 (1999).
20. D. A. Dahl, Idaho National Engineering and Environmental Laboratory, Idaho Falls, ID, 2000).
21. W. C. Wiley and I. H. McLaren, Rev. Sci. Instrum. 26, 1150 (1955).
22. S. M. Colby, C. W. Baker, and J. J. Manura, in Proceedings of the 41st ASMS Conference on Mass Spectrometry and Allied Topics, San Francisco, CA., 1996.
23. T. Bergmann, T. P. Martin, and H. Schaber, Rev. Sci. Instrum. 60, 347 (1989).
24. RoentDek Handels GmbH.
25. http://www.sisweb.com/simion.htm. Scientific Instrument Services, Inc.
26. R. W. Molof, H. L. Schwartz, T. M. Miller, and B. Bederson, Phys. Rev. A 10, 1131 (1974).
27. D. Rayane, R. Antoine, P. Dugourd, and M. Broyer, J. Chem. Phys. 113, 4501 (2000).