Optical characterization of PZT thin films for waveguide applications

Journal of the European Ceramic Society

Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2913-2916

  Cardin, Julien ^a   Leduc, Dominique ^a   Schneider, T ^a   Lupi, C ^a   Averty, D ^a   Gundel, H W ^a  

^a UNIVERSITÉ DE NANTES   (France)

Author keywords

Optical properties; PZT; Sol gel processes; Waveguide

Indexed keywords

CERAMIC MATERIALS; ELECTROOPTICAL DEVICES; GLASS; LEAD COMPOUNDS; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SOL-GELS; THICKNESS MEASUREMENT;

ELECTRO-OPTIC WAVEGUIDES; GLASS SUBSTRATE; M-LINES DEVICE; OPTICAL CHARACTERIZATION;

FERROELECTRIC THIN FILMS;

PIEZOELECTRICITY;

EID: 20444443121     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.163     Document Type: Article

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