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Volumn 52, Issue , 2003, Pages 63-71

Influence of asymmetric oxide electrode structures on the interface capacity and the failure mechanisms in PZT thin films

Author keywords

Fatigue; Imprint; Interface capacity; Oxide electrodes; PZT

Indexed keywords

ELECTRODES; FATIGUE OF MATERIALS; INTERFACES (MATERIALS); IRON COMPOUNDS;

BOTTOM ELECTRODE; IMPRINT; INTERFACE CAPACITY; OXIDE ELECTRODES; PZT;

THIN FILMS;

EID: 20444442554 PISSN: 10584587 EISSN: 16078489 Source Type: Conference Proceeding
DOI: 10.1080/10584580390254123 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.