Micro-Raman mapping and analysis of indentation-induced phase transformations in germanium

Materials Research Society Symposium Proceedings

Volumn 843, Issue , 2005, Pages 277-282

  Jang, Jae Il ^a   Lance, M J ^b   Wen, Songqing ^a   Huening, J J ^c   Nemanich, R J ^c   Pharr, G M ^a,b  

^a University of Tennessee   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; CRYSTALLIZATION; HARDNESS; HYDROSTATIC PRESSURE; INDENTATION; PHASE TRANSITIONS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE PHASES; LOAD DISPLACEMENT CURVES; MICRO-RAMAN MAPPING; NANOINDENTATION;

GERMANIUM;

EID: 20344372658     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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