Extended defect related energy loss in CVD diamond revealed by spectrum imaging in a dedicated STEM

Ultramicroscopy

Volumn 104, Issue 1, 2005, Pages 46-56

  Bangert, U ^a   Harvey, A J ^a   Schreck, M ^b   Hormann F ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

Electron energy loss spectroscopy; Electron microscopy dislocations and other defects; Electronic structure modelling; Synthetic diamonds

Indexed keywords

ADSORPTION; BAND STRUCTURE; CHEMICAL VAPOR DEPOSITION; COMPUTER SOFTWARE; DIAMONDS; DISLOCATIONS (CRYSTALS); ELECTRON ENERGY LOSS SPECTROSCOPY; MICROSTRUCTURE; RELIABILITY; SPECTROMETERS; STATISTICS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM;

BAND GAP ENERGIES; CRYSTAL BAND STRUCTURES; GAUSSIAN DISTRIBUTIONS; UHV ENFINA ELECTRON ENERGY LOSS SPECTROMETER; WIDE BAND GAP SYSTEM DIAMOND;

ENERGY DISSIPATION;

DIAMOND;

AMPLITUDE MODULATION; ANALYTIC METHOD; ARTICLE; CHEMICAL BOND; CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; THEORETICAL STUDY;

EID: 20344369552     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.02.007     Document Type: Article

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