Current single event effects results for candidate spacecraft electronics for NASA

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2004, Pages 10-18

  O'Bryan, Martha V ^a   Seidleck, Christina M ^a   Carts, Martin A ^a   Howard Jr , James W ^b   Kim, Hak S ^b   Forney, James D ^b   Label, Kenneth A ^a   Marshall, Cheryl J ^a   Reed, Robert A ^a   Sanders, Anthony B ^a   Hawkins, Donald K ^a   Cox, Stephen R ^a   Buchner, Stephen P ^c   Oldham, Timothy R ^c   Sutton, John ^c   Irwin, Timothy L ^c   Rodriguez, Elionex ^c   McMorrow, Dale ^d   Kniffin, Scott D ^e   Ladbury, Raymond L ^e   Walter, Mark ^e   Palor, Christopher ^e   Marshall, Paul W ^f   McCall, Moses ^g   Meyer, Steve ^g   Lintz, John ^h   Rapchun, Dave ⁱ   Rodgers, John ^a   Mohammed, Suhail ^a   more..

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b Jackson and Tull Chartered Engineers   (United States)

^c QSS GROUP INC   (United States)

^d NAVAL RESEARCH LABORATORY   (United States)

^e NORTHROP GRUMMAN CORPORATION   (United States)

^f NASA/GSFC Code 565 ^*

^g Honeywell Space Systems Clearwater   (United States)

^h GLOBAL SCIENCE AND TECHNOLOGY   (United States)

ⁱ MOTOROLA INC   (United States)

Author keywords

Heavy ion; Proton; Sacecraft electronics; SEE; Single event effects

Indexed keywords

CRYSTALS; DATA PROCESSING; DIGITAL TO ANALOG CONVERSION; ELECTRONIC EQUIPMENT; ELECTRONS; FLIP FLOP CIRCUITS; HEAVY IONS; IONIZING RADIATION; NANOSTRUCTURED MATERIALS; NITRIC ACID; PROTONS;

NANOCRYSTALS; NATIONAL AERONAUTIC AND SPACE ADMINISTRATION (NASA); SINGLE EVENT EFFECTS (SEE); SINGLE EVENT UPSETS (SEU);

AEROSPACE ENGINEERING;

EID: 20244363640     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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11. [nsrec04_MSU] R. Ladbury, R. A. Reed, P. W. Marshall, K. A. LaBel, R. Anantaraman, R. Fox, D. P. Sanderson, and A. Stolz "Performance of the High-Energy Single-Event Effects Test Facility (SEETF) at Michigan State University's National Superconducting Cyclotron Laboratory (NSCL)," submitted for publication to 2004 IEEE Trans. on Nucl. Sci., Dec 2004.
12. [nsrec04_Marshall] Paul Marshall, Marty Carts, Art Campbell, Ray Ladbury, Robert Reed, Cheryl Marshall, Steve Currie, Dale McMorror, Steve Buchner, Christina Seidleck, Pam Riggs, Karl Fritz Barb Randall, and Barry Gilbert "A Comparative Study of Heavy Ion and Proton Induced Bit Error Sensitivity and Complex Burst Error Modes in Commercially Available High Speed SiGe BiCMOS," submitted for publication to 2004 IEEE on Nucl. Sci., Dec 2004.
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