Induced effects of Cu underlayer on (111) orientation of Fe50Mn50 thin films

Transactions of Nonferrous Metals Society of China (English Edition)

Volumn 15, Issue 2, 2005, Pages 353-357

  Wang, Lei ^a   Wang, Feng Ping ^a   Liu, Huan Ping ^a   Wu, Ping ^a   Qiu, Hong ^a   Pan, Li Qing ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

Cu underlayer; Fe50Mn50 films; Migration

Indexed keywords

ANNEALING; ANTIFERROMAGNETIC MATERIALS; AUGER ELECTRON SPECTROSCOPY; COPPER; CRYSTAL ORIENTATION; ENERGY DISPERSIVE SPECTROSCOPY; IRON ALLOYS; MAGNETRON SPUTTERING; MANGANESE ALLOYS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CU UNDERLAYER; FEMN THIN FILMS; HIGH VACUUM ANNEALING;

MAGNETIC THIN FILMS;

EID: 20144378086     PISSN: 10036326     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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