Exchange biasing of permalloy films by MnxPt1-x: Role of composition and microstructure

Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 6810-6812

  Krishnan, Kannan M ^a   Nelson, C ^a   Echer, C J ^a   Farrow, R F C ^b   Marks, R F ^b   Kellock, A J ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000142009     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367815     Document Type: Article

References (9)

1. J. C. S. Kools, IEEE Trans. Magn. 32, 3165 (1996).
2. W. H. Meiklejohn and C. P. Bean, Phys. Rev. B 102, 1413 (1956).
3. H. Kishi, Y. Kitadae, Y. Miyake, A. Tanaka, and K. Kobayashi, IEEE Trans. Magn. 32, 3380 (1996).
4. T. Lin, D. Mauri, N. Staud, C. Hwang, J. K. Howard, and G. L. Gorman, Appl. Phys. Lett. 65, 1183 (1994).
5. R. F. C. Farrow, R. F. Marks, S. Gider, A. C. Marley, and S. S. P. Parkin, J. Appl. Phys. 81, 4986 (1997).
6. K. M. Krishnan and C. J. Echer, in Analytical Electron Microscopy, edited by D. C. Joy (SF, 1987), p. 99.
7. E. Kren, G. Kadar, L. Pal, J. Solyom, P. Szabo, and T. Tarnoczi, Phys. Rev. 171, 574 (1968).
8. X. Malozemoff, Phys. Rev. B 35, 3679 (1987).
9. N. C. Koon, preprint, 1996 Phys. Rev. Lett. (submitted).