|
Volumn 88, Issue 2, 2005, Pages 187-198
|
Dielectric properties of vacuum deposited Bi2Te3 thin films
|
Author keywords
Bi2Te3 thin films; Dielectric relaxation; Thermal evaporation
|
Indexed keywords
BISMUTH COMPOUNDS;
DIELECTRIC RELAXATION;
ENERGY DISPERSIVE SPECTROSCOPY;
EVAPORATION;
MORPHOLOGY;
PERMITTIVITY;
SCANNING ELECTRON MICROSCOPY;
SURFACE PROPERTIES;
TITANIUM;
VACUUM APPLICATIONS;
BI2TE3 THIN FILMS;
RELAXATION TIME;
THERMAL EVAPORATION;
VACCUM DEPOSITION;
THIN FILMS;
|
EID: 20144371605
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2004.02.052 Document Type: Article |
Times cited : (16)
|
References (31)
|