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Volumn 88, Issue 2, 2005, Pages 187-198

Dielectric properties of vacuum deposited Bi2Te3 thin films

Author keywords

Bi2Te3 thin films; Dielectric relaxation; Thermal evaporation

Indexed keywords

BISMUTH COMPOUNDS; DIELECTRIC RELAXATION; ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; MORPHOLOGY; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; TITANIUM; VACUUM APPLICATIONS;

EID: 20144371605     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.02.052     Document Type: Article
Times cited : (16)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.