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Volumn 5540, Issue , 2004, Pages 22-32
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Multipixel characterization of imaging CZT detectors for hard X-ray imaging and spectroscopy
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Author keywords
CZT characterization; Hard X ray imaging; Multipixel measurements
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Indexed keywords
CRYSTAL STRUCTURE;
IMAGING SYSTEMS;
LEAKAGE CURRENTS;
MATHEMATICAL MODELS;
THICKNESS MEASUREMENT;
X RAY SPECTROSCOPY;
X RAYS;
CD-ZN-TE (CZT) CHARACTERIZATION;
GUARD BAND;
HARD X-RAY IMAGING;
MULTIPIXEL MEASUREMENTS;
RADIATION DETECTORS;
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EID: 20144367102
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.559748 Document Type: Conference Paper |
Times cited : (19)
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References (11)
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