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Volumn 5540, Issue , 2004, Pages 22-32

Multipixel characterization of imaging CZT detectors for hard X-ray imaging and spectroscopy

Author keywords

CZT characterization; Hard X ray imaging; Multipixel measurements

Indexed keywords

CRYSTAL STRUCTURE; IMAGING SYSTEMS; LEAKAGE CURRENTS; MATHEMATICAL MODELS; THICKNESS MEASUREMENT; X RAY SPECTROSCOPY; X RAYS;

EID: 20144367102     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559748     Document Type: Conference Paper
Times cited : (19)

References (11)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.