Interaction between Er ions and shallow impurities in Si nanocrystals within SiO 2

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 11, 2005, Pages

  Imakita, Kenji ^a   Fujii, Minoru ^a   Yamaguchi, Yasuhiro ^a   Hayashi, Shinji ^a  

^a KOBE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ERBIUM; SILICON; SILICON DIOXIDE;

ARTICLE; CRYSTAL; ELECTRON; FILM; MOLECULAR INTERACTION; MOLECULAR PHYSICS; NANOPARTICLE; PHOTOLUMINESCENCE; TEMPERATURE SENSITIVITY;

EID: 20044381742     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.115440     Document Type: Article

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