Off-axis electron holography and microstructure of Ba 0.5Sr 0.5TiO 3 thin films on LaAlO 3

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 11, 2005, Pages

  Tian, H F ^a   Yu, H C ^a   Zhu, X H ^a   Wang, Y G ^a   Zheng, D N ^a   Yang, H X ^a   Li, J Q ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM DERIVATIVE; BARIUM; LANTHANUM; OXYGEN DERIVATIVE; STRONTIUM; TITANIUM DERIVATIVE;

ARTICLE; BIOACCUMULATION; CHEMICAL STRUCTURE; ELECTRON; FILM; HOLOGRAPHY; LOW TEMPERATURE; MEASUREMENT; PHASE TRANSITION; POLARIZATION; ROOM TEMPERATURE;

EID: 20044377663     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.115419     Document Type: Article

References (16)

1. Y. Gim, T. Hudson, Y. Fan, C. Kwon, A. T. Findikoglu, B. J. Gibbons, B. H. Park and Q. X. Jia, Appl. Phys. Lett. 77, 1200 (2000).
2. F. W. Van Keuls, R. R. Romanofsky, D. Y. Bohman, M. D. Winters, F. A. Miranda, C. H. Mueller, R. E. Treece, T. V. Rivkin, and D. Galt, Appl. Phys. Lett. 71, 3075 (1997).
3. K. R. Carroll, J. M. Pond, D. B. Chrisey, J. S. Horwitz, R. E. Leuchtner, and K. S. Grabowski, Appl. Phys. Lett. 62, 1845 (1993).
4. R. A. Chakalov, Z. G. Ivanov, Yu. A. Boikov, P. Larsson, E. Carlsson, S. Gevorgian, and T. Claeson, Physica C 308, 279 (1998).
5. H. C. Li, W. D. Si, A. D. West, and X. X. Xi, Appl. Phys. Lett. 73, 190 (1998).
6. I. Takeuchi, H. Chang, C. Gao, P. G. Schultz, X. D. Xiang, R. P. Sharma, M. J. Downes, and T. Venkatesan, Appl. Phys. Lett. 73, 894 (1998).
7. J. S. Scott, Ferroelectr. Rev. 1, 1 (1998).
8. A. T. Findikoglu, Q. X. Jia, I. H. Campbell, X. D. Wu, D. Reagor, C. B. Mombourquette, and D. McMurry, Appl. Phys. Lett. 66, 3674 (1995).
9. C. L. Chen, H. H. Feng, Z. Zhang, A. Brazdeikis, Z. J. Huang, W. K. Chu, C. W. Chu, F. A. Miranda, F. W. Van Leuls, R. R. Romanofsky, and Y. Liou, Appl. Phys. Lett. 75, 412 (1999).
10. H. J. Gao, C. L. Chen, B. Rafferty, S. J. Pennycook, G. P. Luo, and C. W. Chu, Appl. Phys. Lett. 75, 2542 (1999).
11. H. Lichte, M. Reibold, K. Brand, and M. Lehmann, Ultramicroscopy 93, 199 (2002).
12. X. Zhang, D. C. Joy, Y. Zhang, T. Hashimoto, L. Allard, and T. A. Nolan, Ultramicroscopy 51, 21 (1993).
13. W. Cao and C. Randall, Solid State Commun. 86,435 (1993).
14. M. R. McCartney, D. J. Smith, R. Hull, J. C. Bean, E. Voelkl, and B. Frost, Appl. Phys. Lett. 65, 2603 (1994).
15. K. Harada, M. Beleggia, J. Endo, H. Kasai, Y. Togawa, T. Matsuda, and A. Tonomura J. Electron Microsc. 52, 369 (2003).
16. S. Gevorgian, E. Carlsson, S. Rudner, L.-D. Wernlund, X. Wang, and U. Helwersson, IEE Proc., Part H: Microwaves, Antennas Propag. 143, 397 (1996).