Flexural strength of diamond: Comparison of nanocrystalline thin films, massive chemical vapor deposits, and natural single crystals

Journal of Applied Physics

Volumn 97, Issue 1, 2005, Pages

  Klein, Claude A ^a  

^a Cak Analytics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED STRESS; CUMULATIVE FAILURE; DATA POINTS; MARQUARDT-LVENBERG (ML);

BENDING STRENGTH; CHEMICAL VAPOR DEPOSITION; DATA REDUCTION; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; STATISTICAL METHODS; THIN FILMS;

DIAMONDS;

EID: 19944431455     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1826211     Document Type: Article

References (9)

1. G. Cardinale and C. Robinson, J. Mater. Res. 7, 6 (1992).
2. J. Savage, Proc. SPIE 3060, 144 (1997).
3. C. A. Klein, Diamond Relat. Mater. 11, 218 (2002).
4. J. E. Field, in The Properties of Diamond, edited by, J. E. Field, (Academic, London, 1979), Chap..
5. H. Espinosa, B. Peng, B. Prorok, N. Moldovan, O. Auciello, J. Carlisle, D. Gruen, and D. Mancini, J. Appl. Phys. 94, 6076 (2003).
6. C. Klein, R. Miller, and R. Gentilman, Opt. Eng. 41, 3151 (2002).
7. C. A. Klein, J. Appl. Phys. 96, 3172 (2004).
8. J. Wachtman, Mechanical Properties of Ceramics (Wiley, New York, 1996), Chap..
9. G. Quinn, Engineered Materials Handbook (ASM, Metals Park, Ohio, 1991), Vol. 4, p. 585.