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Volumn 1, Issue , 2003, Pages 59-62

Study of indium and solder bumps for the BTeV pixel detector

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; INDIUM; IRRADIATION; MICROPROCESSOR CHIPS; SOLDERING; THERMAL CYCLING; THERMAL EFFECTS; THERMAL EXPANSION;

EID: 19944426637     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nssmic.2003.1351998     Document Type: Conference Paper
Times cited : (7)

References (7)
  • 1
    • 0037059417 scopus 로고    scopus 로고
    • Characterization of indium and solder bump bonding for pixel detector
    • S. Cihangir and S. Kwan, "Characterization of indium and solder bump bonding for pixel detector," Nucl. Instrum. Methods. Vol. A476, pp. 670 (2002)
    • (2002) Nucl. Instrum. Methods. , vol.A476 , pp. 670
    • Cihangir, S.1    Kwan, S.2
  • 6
    • 0036703251 scopus 로고    scopus 로고
    • Characterization of prototype BTeV silicon pixel sensors before and after irradiation
    • M.R. Coluccia, J.A.Appel, G. Chiodini, D.C. Christian and S.W. Kwan, "Characterization of prototype BTeV silicon pixel sensors before and after irradiation," IEEE Trans. Nucl., Sci, vol. 49, no. 4, pp.1743-1749, 2002.
    • (2002) IEEE Trans. Nucl., Sci , vol.49 , Issue.4 , pp. 1743-1749
    • Coluccia, M.R.1    Appel, J.A.2    Chiodini, G.3    Christian, D.C.4    Kwan, S.W.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.