|
Volumn 1, Issue , 2003, Pages 59-62
|
Study of indium and solder bumps for the BTeV pixel detector
a a a a a a a a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYOGENICS;
INDIUM;
IRRADIATION;
MICROPROCESSOR CHIPS;
SOLDERING;
THERMAL CYCLING;
THERMAL EFFECTS;
THERMAL EXPANSION;
BTEV PIXEL DETECTORS;
FERMILAB TEVTRON;
SILICON GLASS MODULES;
SOLDER BUMPS;
SILICON SENSORS;
|
EID: 19944426637
PISSN: 10957863
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/nssmic.2003.1351998 Document Type: Conference Paper |
Times cited : (7)
|
References (7)
|