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Volumn 45, Issue 4, 2005, Pages 324-328

Study of microstrip mode in RF on-wafer probes

Author keywords

Microstrip mode; On wafer probes

Indexed keywords

ABSORPTION; ATTENUATION; CALIBRATION; COMPUTER SIMULATION; MATHEMATICAL MODELS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; PARAMETER ESTIMATION;

EID: 19944366996     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.20812     Document Type: Article
Times cited : (6)

References (7)
  • 1
    • 84888624361 scopus 로고
    • A microstrip probe for microwave measurements on GaAs FET and IC wafers
    • E. Strid and K.R. Gleason, A microstrip probe for microwave measurements on GaAs FET and IC wafers, IEEE GaAs IC Symp Dig (1980).
    • (1980) IEEE GaAs IC Symp Dig
    • Strid, E.1    Gleason, K.R.2
  • 3
    • 19944362139 scopus 로고    scopus 로고
    • RF probe guide
    • Cascade Microtech, Beaverton, OR
    • RF probe guide, application note, Cascade Microtech, Beaverton, OR.
    • Application Note
  • 4
    • 0036066168 scopus 로고    scopus 로고
    • Sensitivity analysis of calibration standards for fixed probes spacing on wafer calibration techniques
    • A.M.E. Safwat and L. Hayden, Sensitivity analysis of calibration standards for fixed probes spacing on wafer calibration techniques, IEEE MTT-S Int Microwave Symp (IMS) Dig III (2002), 2256-2260.
    • (2002) IEEE MTT-S Int Microwave Symp (IMS) Dig III , pp. 2256-2260
    • Safwat, A.M.E.1    Hayden, L.2
  • 5
    • 0030648297 scopus 로고    scopus 로고
    • Excitation of the parasitic parallel-plate line mode at coplanar discontinuities
    • K. Beilenhoff and W. Heinrich, Excitation of the parasitic parallel-plate line mode at coplanar discontinuities, IEEE MTT-S Int Microwave Symp (IMS) Dig III (1997), 1789-1792.
    • (1997) IEEE MTT-S Int Microwave Symp (IMS) Dig III , pp. 1789-1792
    • Beilenhoff, K.1    Heinrich, W.2
  • 6
    • 19944364140 scopus 로고    scopus 로고
    • High-frequency structures simulator (HFSS)
    • Ansoft
    • High-frequency structures simulator (HFSS), application notes, Ansoft.
    • Application Notes
  • 7
    • 0004531130 scopus 로고    scopus 로고
    • On-wafer vector network analyzer calibration and measurements
    • Cascade Microtech, Beaverton, OR
    • On-wafer vector network analyzer calibration and measurements, application note, Cascade Microtech, Beaverton, OR.
    • Application Note


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.