Influence of top electrode deposition condition on fatigue of Pb(Zr,Ti)O3 thin-film capacitors

Journal of the Korean Physical Society

Volumn 32, Issue 4 SUPPL., 1998, Pages

  Hong, Suk Kyoung ^a   Yang, Hong Geun ^b   Kim, Hyeong Joon ^a  

^a Seoul National University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 19944364242     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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