-
1
-
-
0347417134
-
-
Welton, T. Chem. Rev. 1999, 99, 2071-2083.
-
(1999)
Chem. Rev.
, vol.99
, pp. 2071-2083
-
-
Welton, T.1
-
2
-
-
0037092828
-
-
Zhao, D.; Wu, M.; Kou, Y.; Min, E. Catal. Today 2002, 74, 157-189.
-
(2002)
Catal. Today
, vol.74
, pp. 157-189
-
-
Zhao, D.1
Wu, M.2
Kou, Y.3
Min, E.4
-
3
-
-
3042702603
-
-
Gao, H. X.; Li, J. C.; Han, B. X.; Chen, W. N.; Zhang, J. L.; Zhang, R.; Yan, D. D. Phys. Chem. Chem. Phys. 2004, 6, 2914-2916.
-
(2004)
Phys. Chem. Chem. Phys.
, vol.6
, pp. 2914-2916
-
-
Gao, H.X.1
Li, J.C.2
Han, B.X.3
Chen, W.N.4
Zhang, J.L.5
Zhang, R.6
Yan, D.D.7
-
4
-
-
0034323410
-
-
Nave S.; Eastoe, J.; Heenan, R. K.; Steytler, D.; Grillo, I. Langmuir 2000, 16, 8741-8748.
-
(2000)
Langmuir
, vol.16
, pp. 8741-8748
-
-
Nave, S.1
Eastoe, J.2
Heenan, R.K.3
Steytler, D.4
Grillo, I.5
-
8
-
-
8444242982
-
-
Gordon, C. M.; Holbrey, J. D.; Kennedy, A. R.; Seddon, K. R. J. Mater. Chem. 1998, 8, 2627-2636.
-
(1998)
J. Mater. Chem.
, vol.8
, pp. 2627-2636
-
-
Gordon, C.M.1
Holbrey, J.D.2
Kennedy, A.R.3
Seddon, K.R.4
-
9
-
-
0036812530
-
-
Firestone, M. A.; Dziclawa, J. A.; Zapol, P.; Curtiss, L. A.; Scifert, S.; Dietz, M. L. Langmuir 2002, 18, 7258-7260.
-
(2002)
Langmuir
, vol.18
, pp. 7258-7260
-
-
Firestone, M.A.1
Dziclawa, J.A.2
Zapol, P.3
Curtiss, L.A.4
Scifert, S.5
Dietz, M.L.6
-
10
-
-
0037017902
-
-
Yoshio, M.; Mukai, T.; Kanie, K.; Yoshizawa, M.; Ohno, H.; Kato, T. Adv. Mater. 2002, 14, 351-354.
-
(2002)
Adv. Mater.
, vol.14
, pp. 351-354
-
-
Yoshio, M.1
Mukai, T.2
Kanie, K.3
Yoshizawa, M.4
Ohno, H.5
Kato, T.6
-
11
-
-
0036012094
-
-
Yoshio, M.; Mukai, T.; Kanie, K.; Yoshizawa, M.; Ohno, H.; Kato, T. Chem. Lett. 2002, 320-321.
-
(2002)
Chem. Lett.
, pp. 320-321
-
-
Yoshio, M.1
Mukai, T.2
Kanie, K.3
Yoshizawa, M.4
Ohno, H.5
Kato, T.6
-
12
-
-
0942277363
-
-
Bowers, J.; Vergara-Gutierrez, M. C.; Webster, J. R. P. Langmuir 2004, 20, 309.
-
(2004)
Langmuir
, vol.20
, pp. 309
-
-
Bowers, J.1
Vergara-Gutierrez, M.C.2
Webster, J.R.P.3
-
13
-
-
0025386413
-
-
Shinoda, K.; Fukuda, M.; Carlsson, A. Langmuir 1990, 6, 334-337.
-
(1990)
Langmuir
, vol.6
, pp. 334-337
-
-
Shinoda, K.1
Fukuda, M.2
Carlsson, A.3
-
14
-
-
19744379653
-
-
Aveyard, R.; Binks, B. P.; Fletcher, P. D. I. Langmuir 1989, 5, 1217.
-
(1989)
Langmuir
, vol.5
, pp. 1217
-
-
Aveyard, R.1
Binks, B.P.2
Fletcher, P.D.I.3
-
15
-
-
19744363640
-
-
http://www.ill.fr
-
2O at ILL, whereas at ISIS, a partially deuterated polymer standard was employed.
-
-
-
-
16
-
-
0003944941
-
-
Lindner, P., Zemb, Th., Eds.; Elsevier Science Publishers: Amsterdam, The Netherlands
-
Neutron, X-Ray and Light Scattering: Introduction to an Investigative Tool for Colloidal and Polymeric Systems; Lindner, P., Zemb, Th., Eds.; Elsevier Science Publishers: Amsterdam, The Netherlands, 1990.
-
(1990)
Neutron, X-Ray and Light Scattering: Introduction to an Investigative Tool for Colloidal and Polymeric Systems
-
-
|