Atomic photoionization processes under magnification

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 70, Issue 3, 2004, Pages

  Lepine F ^a   Bordas, Ch ^a   Nicole, C ^b   Vrakking, M J J ^b  

^a University of Lyon   (France)

^b FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; ELECTRIC FIELD EFFECTS; ELECTROSTATICS; IMAGING TECHNIQUES; MATHEMATICAL MODELS; RESONANCE; VELOCITY MEASUREMENT; XENON;

ATOMIC PHOTOIONIZATION; MAGNIFICATION; POTENTIAL APPLICATIONS; STARK RESONANCES;

PHOTOIONIZATION;

EID: 19644400645     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevA.70.033417     Document Type: Article

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