SCOPUS 정보 검색 플랫폼

Physical Review Letters

Volumn 88, Issue 13, 2002, Pages 1330011-1330014

Photoionization microscopy

(5) Nicole, C a Offerhaus, H L a Vrakking, M J J b Lepine F b Bordas, Ch c

a FOM INSTITUTE AMOLF (Netherlands)

b University of Lyon (France)

c PHILIPS RESEARCH LABORATORIES (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTRIC FIELDS; ELECTRONS; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; PARTICLE DETECTORS; PERTURBATION TECHNIQUES; PROBABILITY DISTRIBUTIONS;

PHOTOIONIZATION MICROSCOPY;

PHOTOIONIZATION;

EID: 0036536613 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (83)

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