SCOPUS 정보 검색 플랫폼

Volumn , Issue 1829, 2004, Pages

Machine-integrated ultraprecision testing of optical components in the production process;Fertigungsintegrierte Ultrapräzisionsmessung bei der Produktion optischer Komponenten

(3) Pfeifer, T a Dorner D a Schneefuß, Karsten a,b

a Mess und Qualitäts ^*

b FRAUNHOFER INSTITUTE FOR PRODUCTION TECHNOLOGY IPT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DATASETS ONLINE; INTERFEROMETRIC TECHNIQUES; MANUFACTURING CHAIN; MEASUREMENT SYSTEMS;

COSTS; DATABASE SYSTEMS; INTERFEROMETERS; MICROSTRUCTURE; ONLINE SYSTEMS; PRODUCTION ENGINEERING;

CONTROL SYSTEMS;

EID: 19444387556 PISSN: 00835560 EISSN: None Source Type: Book Series
DOI: None Document Type: Review

Times cited : (1)

References (10)

1
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- Kalibrierung und Rückführung von Interferometern
- Metrologie in der Mikro- und Nanotechnik. Düsseldorf : VDI
- Bai, A.; Geckler, R. D.; Pfeifer, T.: Kalibrierung und Rückführung von Interferometern. In: Metrologie in der Mikro- und Nanotechnik. VDI-Berichte 1669. Düsseldorf : VDI, 2003, S. 147-157
- (2003) VDI-Berichte , vol.1669 , pp. 147-157
- Bai, A.¹ Geckler, R.D.² Pfeifer, T.³

2
- 0035759393
- Testing of aspheric surfaces
- Tiziani, H. J.; Reichelt, S.; Pruss, C.; Rocktaeschel M.; Hofbauer, U.: Testing of aspheric surfaces. In: Proceeding of SPIE Vol. 4440 (2001), S. 109-119
- (2001) Proceeding of SPIE , vol.4440 , pp. 109-119
- Tiziani, H.J.¹ Reichelt, S.² Pruss, C.³ Rocktaeschel, M.⁴ Hofbauer, U.⁵

3
- 0004162202
- US Patent 4,832,489
- Wyant, J.C.; Creath, C.: Two-Wavelength Phase Shifting Interferometer and Method, US Patent 4,832,489, 1986
- (1986) Two-wavelength Phase Shifting Interferometer and Method
- Wyant, J.C.¹ Creath, C.²

4
- 4644314688
- A new approach to in-situ formtest interferometry
- Doerner, D.; Bai, A.; Magalasseril, P.; Pfeifer, T.: A new approach to in-situ formtest interferometry. Proceedings of the IMEKO - XVII World Congress (2003), S. 216-220
- (2003) Proceedings of the IMEKO - XVII World Congress , pp. 216-220
- Doerner, D.¹ Bai, A.² Magalasseril, P.³ Pfeifer, T.⁴

5
- 0003525195
- Academic Press, London
- Wilson, T.; Sheppard, C.: Theory and Practice of Scanning Optical Microscopy. Academic Press, London (1984)
- (1984) Theory and Practice of Scanning Optical Microscopy
- Wilson, T.¹ Sheppard, C.²

6
- 0041708865
- Optical profilometry with digital micromirrors
- Athen 16.-18. Mai
- Bitte, F.; Pfeifer, T.: Optical Profilometry with Digital Micromirrors. Annals of the 34th CIRP International Seminar on Manufacturing Systems, Athen 16.-18. Mai, 2001, S.247-250.
- (2001) Annals of the 34th CIRP International Seminar on Manufacturing Systems , pp. 247-250
- Bitte, F.¹ Pfeifer, T.²

7
- 4644331258
- Eine Alternative zum Laser. Ein Weißlicht-Meßverfahren dringt in den Sub-Micrometer-Bereich ein
- Dietz, C.; Jurca, M.: Eine Alternative zum Laser. Ein Weißlicht-Meßverfahren dringt in den Sub-Micrometer-Bereich ein. In: Sensor Magazin (1997) Nr. 4, S. 15-18
- (1997) Sensor Magazin , vol.4 , pp. 15-18
- Dietz, C.¹ Jurca, M.²

8
- 0003877515
- John Wiley & Sons, New York, Chichester, Brisbane, Toronto, Singapore
- Malacara, D.: Optical Shop Testing, John Wiley & Sons, New York, Chichester, Brisbane, Toronto, Singapore, 1992
- (1992) Optical Shop Testing
- Malacara, D.¹

9
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- Twyman-Green interferometer for testing microspheres
- Schwider, J.; Falkenstörfer, O.: Twyman-Green interferometer for testing microspheres. Optical Engineering 34 (1995) 10, S. 2972-2975.
- (1995) Optical Engineering , vol.34 , Issue.10 , pp. 2972-2975
- Schwider, J.¹ Falkenstörfer, O.²

10
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- Diss. RWTH Aachen
- Mischo, H.: Das Virtuelle Interferometer - Modellgestützte Optimierung, Diss. RWTH Aachen, 2000
- (2000) Das Virtuelle Interferometer - Modellgestützte Optimierung
- Mischo, H.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.