Assembly quality methodology: A new method for evaluating assembly complexity in globally distributed manufacturing

American Society of Mechanical Engineers, Design Engineering Division (Publication) DE

Volumn 116, Issue 1, 2003, Pages 335-344

  Shibata, Hirokazu ^a   Cheldelin, Brent ^b   Ishii, Kosuke ^b  

^a SONY CORPORATION   (Japan)

^b Stanford University   (United States)

Author keywords

Assembly Defect; Assembly Quality Methodology; Complexity Factor; DAC; Design for Assembly; Design for Quality; Statistical Quality Control

Indexed keywords

DECISION MAKING; DEFECTS; MATHEMATICAL MODELS; QUALITY ASSURANCE; QUALITY CONTROL; STATISTICAL METHODS;

ASSEMBLY DEFECT; ASSEMBLY QUALITY METHODOLOGY; COMPLEXITY FACTOR; DAC; DESIGN FOR ASSEMBLY (DFA); DESIGN FOR QUALITY; STATISTICAL QUALITY CONTROL;

ASSEMBLY;

EID: 1942520944     PISSN: 15214613     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2003-42415     Document Type: Conference Paper

References (13)

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