Assembly quality method: Integrating design for assembly cost-effectiveness (DAC) to improve defect prediction

Proceedings of the ASME Design Engineering Technical Conference

Volumn 3, Issue , 2003, Pages 299-306

  Shibata, Hirokazu ^a   Cheldelin, Brent ^b   Ishii, Kosuke ^b  

^a SONY CORPORATION   (Japan)

^b Stanford University   (United States)

Author keywords

Assembly Defect; Complexity Factor; DAC; Design for Assembly; Design for Quality; Quality Control

Indexed keywords

ASSEMBLY; CORRELATION METHODS; COST EFFECTIVENESS; DATA REDUCTION; INFORMATION TECHNOLOGY; QUALITY CONTROL; SALES; AUDIO ACOUSTICS; DEFECTS;

ASSEMBLY DEFECTS; COMPLEXITY FACTORS; DAC; DESIGN FOR ASSEMBLY; DESIGN FOR QUALITY; ASSEMBLY COSTS; ASSEMBLY DEFECT; ASSEMBLY QUALITY; DESIGN FOR ASSEMBLY COST-EFFECTIVENESS; DESIGN FOR QUALITIES; INTEGRATING DESIGN; QUALITY METHODS;

PRODUCT DESIGN; COST EFFECTIVENESS;

EID: 1842709248     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/detc2003/dfm-48163     Document Type: Conference Paper

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