In-Plane Thermal Diffusivity Measurement of Thin Films Based on the Alternating-Current Calorimetric Method Using an Optical Reflectivity Technique

Chinese Physics Letters

Volumn 21, Issue 4, 2004, Pages 713-715

  Huang, Zheng Xing ^a   Tang, Zhen An ^a   Xu, Zi Qiang ^a   Ding, Hai Tao ^a   Gu, Yu Qin ^b  

^a DALIAN UNIVERSITY OF TECHNOLOGY   (China)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CALORIMETRY; HEAT CONDUCTION; REFLECTION; TEMPERATURE DISTRIBUTION; THERMAL DIFFUSION IN SOLIDS;

ALTERNATING CURRENT; CALORIMETRIC METHODS; CONTINUOUS WAVE; HE-NE LASERS; INFRARED-LASER; MEASUREMENTS OF; OPTICAL REFLECTIVITY; PHOTORECEIVERS; REFLECTIVITY TECHNIQUE; THIN-FILMS;

THERMAL DIFFUSIVITY;

EID: 1942505386     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/21/4/035     Document Type: Article

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