Interpixel capacitance in non-destructive focal plane arrays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5167, Issue , 2004, Pages 204-215

  Moore, Andrew C ^a,b   Ninkov, Zoran ^a   Forrest, William J ^b  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

Astronomical Imagers; CMOS Imagers; Interpixel capacitance; MTF; PIN array

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CROSSTALK; IMAGE ANALYSIS; NONDESTRUCTIVE EXAMINATION; POISSON DISTRIBUTION; QUANTUM EFFICIENCY; RANDOM PROCESSES; SENSITIVITY ANALYSIS;

ASTRONOMICAL IMAGERS; CMOS IMAGERS; INTERPIXEL CAPACITANCE; MTF; PIN ARRAY;

ASTRONOMY;

EID: 1942486901     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.507330     Document Type: Conference Paper

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