X-ray multiple diffraction (Umweganregung) in wurtzite-type GaN and ZnO epitaxial layers

Physica Status Solidi (A) Applied Research

Volumn 201, Issue 4, 2004, Pages

  Biasing J ^a   Krost, A ^a  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; FIBER BRAGG GRATINGS; LIGHT REFLECTION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NONDESTRUCTIVE EXAMINATION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

CRYSTALLINE QUALITY; X RAY MULTIPLE DIFFRACTIONS;

GALLIUM NITRIDE;

EID: 1942475131     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200409030     Document Type: Article

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