X-ray double diffraction (umweganregung) in SiC monocrystals

Physica Status Solidi (B) Basic Research

Volumn 200, Issue 2, 1997, Pages 377-383

  Dressler, L ^a   Goetz, K ^a   Krausslich J ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031527037     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(199704)200:2<377::AID-PSSB377>3.0.CO;2-E     Document Type: Article

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