Thermal phase change and activation energy of crystallization of Ge-Sb-Te-Sn thin films

Chinese Optics Letters

Volumn 1, Issue 12, 2003, Pages 716-718

  Gu, Sipeng ^a,b   Hou, Lisong ^a   Zhao, Qitao ^a   Huang, Rui'an ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL SCANNING CALORIMETRY; OPTICAL FILMS; X RAY DIFFRACTION ANALYSIS;

GERMANIUM ANTIMONY TELLURIUM TIN THIN FILMS; OPTICAL RECORDING MEDIA; PHASE CHANGED OPTICAL FILMS; THERMAL PHASE CHANGES;

OPTICAL DATA STORAGE;

EID: 1942445310     PISSN: 16717694     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. T. H. Jeong, M. R. Kim, and H. Seo, J. Appl. Phys. 8979, 774 (1999).
2. M. R. Kim, H. Seo, and T. H. Jung, Proc. SPIE 3401, 259 (1998).
3. C.-M. Lee, T.-S. Chin, and Y.-Y. Huang, Jpn. J. Appl. Phys 39, 6369 (2000).
4. F. X. Can, L. S. Hou, and G. B. Wang, Mat. Sci. and Eng. B 76, 63 (2000).
5. F. S. Jiang and M. Okuda, Jpn. J. Appl. Phys. 30, 97 (1991).
6. H. F. Hu, F. Y. Lin, and Y. B. Yuan, J. Non-Cryst. Solids 112, 306 (1989).
7. H. Yinnon and D. R. Uhlmann, J. Non-Cryst. Solids 54, 253 (1983).