Out-of-plane mosaic of single-wall carbon nanotube films

Applied Physics Letters

Volumn 84, Issue 12, 2004, Pages 2172-2174

  Zhou, W ^a   Winey, K I ^a   Fischer, J E ^a   Sreekumar, T V ^b   Kumar, S ^b   Kataura, H ^c  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^c TOKYO METROPOLITAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FILTER MEMBRANES; LATTICE DIFFRACTION; SINGLE-WALL CARBON NANOTUBES (SWNT);

CASTING; CRYSTAL LATTICES; DENSITY (SPECIFIC GRAVITY); DEPOSITION; DISPERSIONS; LIGHT POLARIZATION; MAGNETIC FIELDS; RAMAN SCATTERING; SUBSTRATES; SURFACE ACTIVE AGENTS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY SCATTERING;

CARBON NANOTUBES;

EID: 1942444602     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1689405     Document Type: Article

References (18)

1. R. Saito, G. Dresselhaus, and M. S. Dresselhaus, Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998).
2. L. Jin, C. Bower, and O. Zhou, Appl. Phys. Lett. 73, 1197 (1998).
3. R. Haggenmueller, H. H. Gommans, A. G. Rinzler, J. E. Fischer, and K. I. Winey, Chem. Phys. Lett. 330, 219 (2000).
4. B. Vigolo, A. Penicaud, C. Coulon, C. Sander, R. Pallier, C. Journet, P. Bernier, and P. Poulin, Science 290, 1331 (2000).
5. D. A. Walters, M. J. Casavant, X. C. Qin, C. B. Huffman, P. J. Boul, L. M. Ericson, E. H. Haroz, M. J. O'Connell, K. Smith, D. T. Colbert, and R. E. Smalley, Chem. Phys. Lett. 338, 14 (2001).
6. P. Launois, A. Marucci, B. Vigolo, A. Derre, and P. Poulin, J. Nanosci. Nanotechnol. 1, 125 (2001).
7. W. Zhou, J. Vavro, C. Guthy, K. I. Winey, J. E. Fischer, L. M. Ericson, S. Ramesh, R. Saini, V. A. Davis, C. Kittrell, M. Pasquali, R. H. Hauge, and R. E. Smalley, J. Appl. Phys. 95, 649 (2004).
8. J. E. Fischer, W. Zhou, J. Vavro, M. C. Llaguno, C. Guthy, R. Haggenmueller, M. J. Casavant, D. E. Walters, and R. E. Smalley, J. Appl. Phys. 93, 2157 (2003).
9. N. Bendiab, R. Almairac, J.-L. Sauvajol, S. Rols, and E. Elkaim, J. Appl. Phys. 93, 1769 (2003).
10. B. Q. Wei, R. Vajtai, Y. Y. Choi, P. M. Ajayan, H. Zhu, C. Xu, and D. Wu, Nano Lett. 2, 1105 (2002).
11. http://www.lrsm.upenn.edu/lrsm/facMAXS.html (description of apparatus).
12. The film plane was ensured to be parallel to the incident beam with the aid of an x-ray imaging camera. Scattered intensity was corrected for absorption by the sample, and background scattering from the empty capillary, etc., was subtracted. The χ resolution is better than 2.6° (measurement of graphite with known FWHM). The real out-of-plane FWHMs could be 0°-5° smaller than the measured values due to misalignment of several sandwiched films.
13. M. F. Islam, E. Rojas, D. M. Bergey, A. T. Johnson, and A. G. Yodh, Nano Lett. 3, 269 (2003).
14. T. V. Sreekumar, T. Liu, S. Kumar, L. M. Ericson, R. H. Hauge, and R. E. Smalley, Chem. Mater. 15, 175 (2003).
15. A better fit was achieved by adding a Lorentzian component while the area-weighted average FWHM (26°) is quite close to the value obtained with just the Gaussian, so we use pure Gaussian for comparison purposes.
16. H. Kataura, Y. Maniwa, M. Abe, A. Fujiwara, T. Kodama, K. Kikuchi, H. Imahori, Y. Misaki, S. Suzuki, and Y. Achiba, Appl. Phys. A: Mater. Sci. Process. 74, 349 (2002).
17. B. W. Smith, R. M. Russo, S. B. Chikkannanavar, and D. E. Luzzi, J. Appl. Phys. 91, 9333 (2002).
18. M. Hodak, Ph.D. thesis, University of Pennsylvania, 2002, in which can be found an as yet unpublished LDA calculation which gives the experimental lattice constant to within 0.01 Å.