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Volumn 24, Issue 10-11, 2004, Pages 2983-2987

An investigation of large fatigue rate in < 1 1 1 >cub-oriented Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystal

Author keywords

Domain configuration; Electron microscopy; Fatigue; Microcracking; Optical microscopy; Pb(Mg; Nb)O3; PbTiO3; Perovskites

Indexed keywords

CRYSTAL ORIENTATION; FATIGUE OF MATERIALS; MICROCRACKING; OPTICAL MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 1942434523     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2003.10.017     Document Type: Article
Times cited : (5)

References (16)
  • 2
    • 0031237724 scopus 로고    scopus 로고
    • Characteristics of relaxor-based piezoelectric single crystals for ultrasonic transducers
    • Park S.E. Shrout T.R. Characteristics of relaxor-based piezoelectric single crystals for ultrasonic transducers IEEE Trans. UFFC 44 5 1997 1140-1147
    • (1997) IEEE Trans. UFFC , vol.44 , Issue.5 , pp. 1140-1147
    • Park, S.E.1    Shrout, T.R.2
  • 6
    • 0031211577 scopus 로고    scopus 로고
    • Ultrahigh strain and piezoelectric behavior in relaxor based ferroelectric single crystals
    • Park S.E. Shrout T.R. Ultrahigh strain and piezoelectric behavior in relaxor based ferroelectric single crystals J. Appl. Phys. 82 4 1997 1804-1811
    • (1997) J. Appl. Phys. , vol.82 , Issue.4 , pp. 1804-1811
    • Park, S.E.1    Shrout, T.R.2
  • 12
    • 0031161969 scopus 로고    scopus 로고
    • Domain-related phase tansitionlike behavoir in lead zinc niobate relaxor ferroelectric single crystals
    • Mulvihill M.L. Cross L.E. Cao W.W. Uchino K. Domain-related phase tansitionlike behavoir in lead zinc niobate relaxor ferroelectric single crystals J. Am. Ceram. Soc. 80 6 1997 1462-1468
    • (1997) J. Am. Ceram. Soc. , vol.80 , Issue.6 , pp. 1462-1468
    • Mulvihill, M.L.1    Cross, L.E.2    Cao, W.W.3    Uchino, K.4
  • 14
    • 0038715786 scopus 로고    scopus 로고
    • In situ TEM study of electric field-induced microcracking in piezoelectric single crystals
    • Xu Z. In situ TEM study of electric field-induced microcracking in piezoelectric single crystals Mater. Sci. and Eng. B 99 2003 106-111
    • (2003) Mater. Sci. and Eng. B , vol.99 , pp. 106-111
    • Xu, Z.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.