In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

Materials Science and Engineering: B

Volumn 99, Issue 1-3, 2003, Pages 106-111

  Xu, Zhengkui ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Domain boundary; In situ TEM; Microcracking; Piezoelectric single crystals

Indexed keywords

ELECTRIC FIELD EFFECTS; FATIGUE OF MATERIALS; LEAD COMPOUNDS; MICROCRACKING; PIEZOELECTRIC MATERIALS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC CYCLING;

SINGLE CRYSTALS;

EID: 0038715786     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00430-0     Document Type: Conference Paper

References (18)

1. Park S.E., Mulvihill M.L., Risch G., Shrout T.R. Jpn. J. Appl. Phys. 36:1997;1154.
2. Ye Z.G., Noheda B., Dong M., Cox D., Shirane G. Phys. Rev. B64:2001;184114-1.
3. Masuzawa H., Ito Y., Nakaya C., Takeuchi H., Jyomura S. Jpn. J. Appl. Phys. 28:1989;101.
4. Kelly J., Leonard M., Tantigate C., Safari A. J. Am. Ceram. Soc. 80:1997;957.
5. Park S.E., Shrout T.R. J. Appl. Phys. 82:1804;1997.
6. Jiang Q., Cao W., Cross L.E. J. Am. Ceram. Soc. 77:1994;211.
7. Cao H., Evans A.G. J. Am. Ceram. Soc. 77:1994;1783.
8. Wang H., Singh R.N. Ferroelectrics. 168:1995;281.
9. Lynch C.S., Yang W., Collier L., Suo Z., McMeeking R.M. Ferroelectrics. 166:1995;11.
10. Tajima K., Hwang H.J., Sando M. J. Am. Ceram. Soc. 83:2000;651.
11. White G., Raynes A., Vaudin M., Freiman S. J. Am. Ceram. Soc. 77:1994;2605.
12. Snoeck E., Normand L., Thorel A., Roucau C. Phase Trans. 46:1994;77.
13. Lin X., Murray C., Dravid V.P. Proc. Microscopy Microanal. 552:1998;1998.
14. Krishnan A., Bisher M.E., Treacy M.M. J. Proc. Microscopy Microanal. 780:1999;1999.
15. Xu Z., Tan X., Han P., Shang J.K. Appl. Phys. Lett. 76:2000;3732.
16. Tan X., Xu Z., Shang J.K., Han P. Appl. Phys. Lett. 77:2000;1529.
17. Xu Z., Kim M.C., Li J.F., Viehland D. Philos. Mag. A74:1996;395.
18. Barnett D.M., Lothe J. Phys. Status Solid. B67:1975;105.