Spatially adaptive wavelet denoising using the minimum description length principle

IEEE Transactions on Image Processing

Volumn 13, Issue 2, 2004, Pages 179-187

  Xie, Jiecheng ^a   Zhang, Dali ^a   Xu, Wenli ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Coefficients model; Minimum description length (MDL); Threshold; Wavelet denoising; Wavelet transform

Indexed keywords

COMPUTER SIMULATION; DIGITAL IMAGE STORAGE; IMAGE COMPRESSION; IMAGE QUALITY; MAXIMUM LIKELIHOOD ESTIMATION; OPTIMIZATION; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; SIGNAL TO NOISE RATIO; WAVELET TRANSFORMS;

ADAPTIVE WAVELET DENOISING; COEFFICIENT MODEL; MINIMUM DESCRIPTION LENGTH PRINCIPLE; WAVELET COEFFICIENT;

IMAGE RECONSTRUCTION;

ALGORITHM; ARTICLE; COMPARATIVE STUDY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING; STATISTICAL MODEL; STATISTICS; VALIDATION STUDY;

ALGORITHMS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; MODELS, STATISTICAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED; STOCHASTIC PROCESSES;

EID: 1942421816     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIP.2004.823828     Document Type: Article

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