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Volumn 33, Issue 5, 1997, Pages 223-227

NIST study investigates retardance uncertainty

Author keywords

[No Author keywords available]

Indexed keywords


EID: 1942419868     PISSN: 10438092     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review
Times cited : (15)

References (4)
  • 1
    • 0000024308 scopus 로고    scopus 로고
    • Design and performance of a stable linear retarder
    • to be published May
    • K. B. Rochford et al., "Design and performance of a stable linear retarder," to be published in Appl. Opt. (May 1997).
    • (1997) Appl. Opt.
    • Rochford, K.B.1
  • 2
    • 0000976494 scopus 로고    scopus 로고
    • Rotating-polarizer polarimeter for accurate retardance measurement
    • to be published May
    • P. A. Williams, A. H. Rose, and C. M. Wang, "Rotating-polarizer polarimeter for accurate retardance measurement," to be published in Appl. Opt. (May 1997).
    • (1997) Appl. Opt.
    • Williams, P.A.1    Rose, A.H.2    Wang, C.M.3
  • 4
    • 0009721107 scopus 로고    scopus 로고
    • Accuracy of interferometric retardance measurements
    • to be published May
    • K. B. Rochford and C. M. Wang, "Accuracy of interferometric retardance measurements," to be published in Appl. Opt. (May 1997).
    • (1997) Appl. Opt.
    • Rochford, K.B.1    Wang, C.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.