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Volumn 52, Issue 4, 2005, Pages 604-609

Analysis of thickness-extensional waves propagating in the lateral direction of solidly mounted piezoelectric thin film resonators

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC WAVE PROPAGATION; BOUNDARY CONDITIONS; ELECTRODES; FREQUENCIES; NUMERICAL ANALYSIS; RESONANCE; RESONATORS; THIN FILMS;

EID: 19344366495     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2005.1428043     Document Type: Article
Times cited : (5)

References (14)
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    • Theoretical analysis of a piezoelectric thin film resonator with acoustic quarter-wave multilayers
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    • Nakamura, K.1    Kanbara, H.2
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    • R. S. Naik, J. J. Lutsky, R. Reif, and C. G. Sodini, " Electromechanical coupling constant extraction of thin-film piezoelectric materials using a bulk acoustic wave resonator," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 45, no. 1, pp. 257-263, 1998.
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    • Analysis of piezoelectric thin film resonators with acoustic quarter-wave multilayers
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    • Kanbara, H.1    Kobayashi, H.2    Nakamura, K.3
  • 8
    • 0036578471 scopus 로고    scopus 로고
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    • H. Kobayashi, Y. Ishida, K. Ishikawa, A. Doi, and K. Nakamura, "Fabrication of piezoelectric thin film resonators with acoustic quarter-wave multilayers," Jpn. J. Appl. Phys., vol. 41, pt. 1, no. 5B, pp. 3455-3457, 2002.
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  • 9
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  • 10
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    • Analysis of thickness-extensional waves propagating in the lateral direction of solidly mounted piezoelectric thin film resonators
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.