Diagnosing manufacturing variation using second-order and fourth-order statistics

International Journal of Flexible Manufacturing Systems

Volumn 16, Issue 1, 2004, Pages 45-64

  Lee, Ho Young ^a   Apley, Daniel W ^b  

^a Department of Electrical and Computer Engineering   (United States)

^b Northwestern University   (United States)

Author keywords

Blind source separation; Factor rotation; Manufacturing variation; Multivariate statistical process control; Principal components analysis

Indexed keywords

ALGORITHMS; BLIND SOURCE SEPARATION; MATHEMATICAL MODELS; PRINCIPAL COMPONENT ANALYSIS; PRINTED CIRCUIT BOARDS; PROCESS CONTROL; SCREEN PRINTING; STATISTICAL PROCESS CONTROL;

BLIND SEPARATION ALGORITHMS; FACTOR ROTATION; MANUFACTURING VARIATION; X-RAY LAMINOGRAPHY;

FLEXIBLE MANUFACTURING SYSTEMS;

EID: 19244366610     PISSN: 09206299     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:FLEX.0000039172.84756.39     Document Type: Article

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